The REDWAVE XRF-M analyses and evaluates materials according to chemical composition. Unwanted parts are reliably detected and sorted.
In contrast to other technologies, moisture, colour and surface impurities have no negative effect on the detection ability. This technology can be used in sorting processes to recognise an accumulation of element characteristics, including the detection of undesired materials.
|Technical specifications:||REDWAVE XRF-M:|
|Sensor system||EDXRF energy dispersive X-ray fluorescence spectrometer|
|Sorting width||450 mm - 1370 mm|
|Throughput rate||dependent on material and grain size|